Associate Professor at Fudan University, China
Prof. Yan Li is an accomplished Associate Professor at Fudan University, with a strong background in Electrical Engineering and Integrated Circuits, earning his Ph.D. from Karlsruhe Institute of Technology ๐. His research focuses on high-reliable integrated circuit design and dependable AI, addressing challenges in harsh environments ๐ง๐ก. He has made significant contributions to soft-error-tolerant circuits, pioneering solutions that span circuit-level to EDA algorithms. ๐ His leadership is evident in high-impact publications and mentoring of emerging researchers ๐. Prof. Li has secured competitive funding, including the Youth Fund of the National Natural Science Foundation of China and Shanghai Pujiang Program ๐ผ. Recognized as a Shanghai Pujiang Talent and Super Postdoctoral Fellow, He stands out as a top-tier researcher and innovator in the field of reliable microelectronics.
Professional Profileย
Education ๐
Prof. Yan Liโs educational journey reflects his strong academic foundation in Electrical Engineering and Microelectronics. He earned his Ph.D. at the Karlsruhe Institute of Technology, Germany, where he honed his expertise in integrated circuit design and reliability. Complementing this, he completed her M.S. in Integrated Circuit Engineering and B.S. in Electronic Information Engineering at Fudan University and Northeastern University, respectively. ๐ His academic path equipped his with both theoretical knowledge and hands-on skills, bridging European and Chinese engineering education traditions. This diverse educational background empowers his interdisciplinary approach, blending rigorous hardware research with emerging AI applications ๐. Prof. Liโs education serves as a solid platform for his innovative research, fostering both creativity and precision in addressing the challenges of modern microelectronics and robust computing systems. ๐
Professional Experience ๐ผ
Prof. Yan Liโs professional journey is marked by progressive roles at Fudan University, where he currently serves as an Associate Professor at the State Key Laboratory of Integrated Chips and Systems. ๐ฉโ๐ซ From 2022 to 2024, he was a Postdoctoral Fellow, deepening his expertise in soft-error mitigation and robust circuit design. His leadership extends beyond academia, mentoring numerous masterโs and Ph.D. students, many of whom have transitioned into roles in academia, startups, and industry ๐งโ๐. He also contributes as a reviewer for prestigious journals like IEEE JSSC and TCAS, shaping the scholarly discourse. Prof. Liโs professional experience showcases his ability to integrate teaching, research, and service, reinforcing his reputation as a dedicated researcher and mentor committed to advancing reliable microelectronics.
Research Interest ๐
Prof. Yan Liโs research interests lie at the intersection of high-reliable integrated circuit design and dependable AI systems, addressing critical challenges in harsh operational environments ๐. He focuses on developing digital circuits that maintain performance under radiation and transient faults, pioneering solutions like soft-error-tolerant architectures and hardened latches ๐ ๏ธ. Prof. Li also bridges hardware reliability and AI robustness by proposing cross-layer his that span from circuits to algorithms, aiming to enhance the dependability of AI/ML systems under uncertain or adversarial conditions ๐ค. His interdisciplinary approach not only advances fundamental design but also supports practical deployment of robust systems in aerospace, automotive, and mission-critical applications. His work positions his as a leader in creating reliable and efficient circuits for the next generation of electronics. ๐๐
Awards and Honors ๐
Prof. Yan Liโs excellence has been recognized through numerous awards and honors, underscoring his impact on the field of microelectronics. He was named a Shanghai Pujiang Talent in 2022, a prestigious recognition highlighting his contributions to technological innovation in China ๐. He also received the Super Postdoctoral Fellowship from Fudan University, reflecting his exceptional postdoctoral research performance ๐. His dedication to academic excellence was further recognized with the Shanghai Outstanding Graduates (top 5%) and the National Scholarship (top 5%) in 2021 ๐๏ธ. These accolades, coupled with competitive funding from the National Natural Science Foundation of China and Shanghai Pujiang Program, showcase his as a highly respected researcher and mentor. His honors celebrate both her technical achievements and her commitment to mentoring the next generation of engineers. ๐ฉโ๐
Research Skills ๐งฉ
Prof. Yan Li possesses a rich skill set in advanced integrated circuit design, focusing on robust and reliable solutions for soft-error tolerance and radiation-hardened applications ๐ง. He excels in developing multi-objective optimization frameworks using Bayesian optimization and machine learning techniques, balancing design trade-offs effectively ๐ค. His skills extend to Electronic Design Automation (EDA), where He leverages cutting-edge methodologies to enhance digital circuit reliability and performance. Prof. Liโs expertise also includes designing hardened latches, flip-flops, and combinational circuits, demonstrating versatility from device-level design to system-level integration ๐ ๏ธ. He adeptly mentors young researchers, guiding them in both technical and academic growth. His comprehensive skill set positions his as a leader in innovative circuit design for dependable systems in critical applications. ๐๐
Publications Top Note ๐
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Title: A robust hardened latch featuring tolerance to double-node-upset in 28nm CMOS for spaceborne application
Authors: Y. Li, X. Cheng, C. Tan, J. Han, Y. Zhao, L. Wang, T. Li, M.B. Tahoori, X. Zeng
Year: 2020
Citations: 31
Source: IEEE Transactions on Circuits and Systems II: Express Briefs, 67(9), 1619โ1623
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Title: A non-redundant latch with key-node-upset obstacle of beneficial efficiency for harsh environments applications
Authors: Y. Liu, Y. Li, X. Cheng, J. Han, X. Zeng
Year: 2023
Citations: 17
Source: IEEE Transactions on Circuits and Systems I: Regular Papers, 70(4), 1639โ1648
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Title: General Efficient TMR for Combinational Circuit Hardening Against Soft Errors and Improved Multi-objective Optimization Framework
Authors: C. Tan, Y. Li, X. Cheng, J. Han, X. Zeng
Year: 2021
Citations: 10
Source: IEEE Transactions on Circuits and Systems I: Regular Papers
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Title: A Multi-objective Optimization Framework to Design Soft-Error-Immune Circuit
Authors: Y. Li, J. Han, Y. Han, X. Zeng, X. Zeng
Year: 2019
Citations: 6
Source: 2019 European Conference on Radiation and its Effects on Components and Systems (RADECS)
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Title: Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit
Authors: Y. Li, X. Zeng, Z. Gao, L. Lin, J. Tao, J. Han, X. Cheng, M.B. Tahoori, X. Zeng
Year: 2020
Citations: 5
Source: 2020 57th ACM/IEEE Design Automation Conference (DAC), 1โ6
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Title: DMBF: Design Metrics Balancing Framework for Soft-Error-Tolerant Digital Circuits Through Bayesian Optimization
Authors: Y. Li, C. Chen, X. Cheng, J. Han, X. Zeng
Year: 2023
Citations: 3
Source: IEEE Transactions on Circuits and Systems I: Regular Papers
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Title: ้ขๅๅไธ่ชๅคฉๅซๆๆๆฌๆ็็ไธๆจกๅไฝ่ฝฏ้่ฏฏ้ฒๆคๆๆฏ: ่ฟไผผ่ฎก็ฎ็ๅฎ่ทต (Triple Modular Redundancy Soft Error Protection for Commercial Space Satellites: Approximate Computing Practice)
Authors: Y. Li, Y.M. Hu, X.Y. Zeng
Year: 2024
Citations: 1
Source: ็ตๅญไธไฟกๆฏๅญฆๆฅ, 46, 1โ9
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Title: TRIGON: A Single-phase-clocking Low Power Hardened Flip-Flop with Tolerance to Double-Node-Upset for Harsh Environments Applications
Authors: Y. Li, J. Han, X. Zeng, M.B. Tahoori
Year: 2021
Citations: 1
Source: 2021 Design, Automation and Test in Europe Conference (DATE)
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Title: Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology
Authors: C. Zhang, Y. Li, W. Zhan, W. Geng, T. Liang, X. Zeng
Year: 2024
Source: Microelectronics Journal, 143, 106055
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Title: Research on multi-objective optimization of radiation hardened integrated circuits based on “BP NSGA-III” optimization architecture
Authors: H. Huang, Y. Li, L. Wang, C. Liu, Y. Zhao
Year: 2023
Source: 5th International Conference on Radiation Effects of Electronic Devices
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Title: Research on anti single event transient multi-objective optimization technology based on sensitive flip-flop replacement
Authors: H. Huang, Y. Zhao, L. Wang, C. Liu, Y. Li
Year: 2023
Source: Second International Conference on Digital Society and Intelligent Systems
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Title: An Improved Multi-Objective Optimization Framework for Soft-Error Immune Circuits
Authors: S. Chu, Y. Li, X. Cheng, X. Zeng
Year: 2022
Source: 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
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Title: Multi-objective Optimization Hardening Design for Multiplier Circuit
Authors: C. Chen, Y. Li, X. Cheng, J. Han, X. Zeng
Year: 2022
Source: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
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Title: Impact of Tap Cell on Single Event Transient in 28-nm CMOS Technology
Authors: C. Zhang, C. Tan, Y. Li, X. Cheng, J. Han, X. Zeng
Year: 2022
Source: 2022 European Conference on Radiation and its Effects on Components and Systems (RADECS)
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Title: Pulse Quenching Effect Characterized by Inverter Chains under Heavy-ion Irradiation in 28-nm CMOS Technology
Authors: C. Tan, Y. Li, S. Chu, R. Chen, X. Cheng, J. Han, X. Zeng
Year: 2022
Source: 2022 European Conference on Radiation and its Effects on Components and Systems (RADECS)
Conclusion ๐ก
In conclusion, Prof. Yan Li emerges as an outstanding researcher and mentor in the field of reliable microelectronics. His robust educational background, dynamic professional experience, and interdisciplinary research in high-reliability circuits and dependable AI systems position his at the forefront of his field ๐. His impressive portfolio of publications, mentorship, and service to the academic community underscores his dedication to advancing the state of the art while nurturing the next generation of engineers ๐ฉโ๐ซ. Prof. Liโs combination of technical excellence, research innovation, and leadership qualities makes his a deserving candidate for the Best Researcher Award, embodying both academic brilliance and transformative impact on the broader microelectronics landscape. ๐
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